Hajra Naeem, Manar H. Alalfi. Identifying Vulnerable IoT Applications using Deep Learning. In Kostas Kontogiannis, Foutse Khomh, Alexander Chatzigeorgiou, Marios-Eleftherios Fokaefs, Minghui Zhou, editors, 27th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2020, London, ON, Canada, February 18-21, 2020. pages 582-586, IEEE, 2020. [doi]
Abstract is missing.