Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model

Muhammad Rashid Naeem, Tao Lin, Hamad Naeem, Farhan Ullah, Saqib Saeed. Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model. IEEE Access, 7:158264-158283, 2019. [doi]

Authors

Muhammad Rashid Naeem

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Tao Lin

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Hamad Naeem

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Farhan Ullah

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Saqib Saeed

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