Muhammad Rashid Naeem, Tao Lin, Hamad Naeem, Farhan Ullah, Saqib Saeed. Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model. IEEE Access, 7:158264-158283, 2019. [doi]
@article{NaeemLNUS19,
title = {Scalable Mutation Testing Using Predictive Analysis of Deep Learning Model},
author = {Muhammad Rashid Naeem and Tao Lin and Hamad Naeem and Farhan Ullah and Saqib Saeed},
year = {2019},
doi = {10.1109/ACCESS.2019.2950171},
url = {https://doi.org/10.1109/ACCESS.2019.2950171},
researchr = {https://researchr.org/publication/NaeemLNUS19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {158264-158283},
}