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Connecting Software Reliability Growth Models to Software Defect Tracking

Maskura Nafreen, Melanie Luperon, Lance Fiondella, Vidhyashree Nagaraju, Ying Shi, Thierry Wandji. Connecting Software Reliability Growth Models to Software Defect Tracking. In Marco Vieira, Henrique Madeira, Nuno Antunes, Zheng Zheng 0001, editors, 31st IEEE International Symposium on Software Reliability Engineering, ISSRE 2020, Coimbra, Portugal, October 12-15, 2020. pages 138-147, IEEE, 2020. [doi]

Authors

Maskura Nafreen

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Melanie Luperon

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Lance Fiondella

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Vidhyashree Nagaraju

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Ying Shi

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Thierry Wandji

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