Maskura Nafreen, Melanie Luperon, Lance Fiondella, Vidhyashree Nagaraju, Ying Shi, Thierry Wandji. Connecting Software Reliability Growth Models to Software Defect Tracking. In Marco Vieira, Henrique Madeira, Nuno Antunes, Zheng Zheng 0001, editors, 31st IEEE International Symposium on Software Reliability Engineering, ISSRE 2020, Coimbra, Portugal, October 12-15, 2020. pages 138-147, IEEE, 2020. [doi]
@inproceedings{NafreenLFNSW20,
title = {Connecting Software Reliability Growth Models to Software Defect Tracking},
author = {Maskura Nafreen and Melanie Luperon and Lance Fiondella and Vidhyashree Nagaraju and Ying Shi and Thierry Wandji},
year = {2020},
doi = {10.1109/ISSRE5003.2020.00022},
url = {https://doi.org/10.1109/ISSRE5003.2020.00022},
researchr = {https://researchr.org/publication/NafreenLFNSW20},
cites = {0},
citedby = {0},
pages = {138-147},
booktitle = {31st IEEE International Symposium on Software Reliability Engineering, ISSRE 2020, Coimbra, Portugal, October 12-15, 2020},
editor = {Marco Vieira and Henrique Madeira and Nuno Antunes and Zheng Zheng 0001},
publisher = {IEEE},
isbn = {978-1-7281-9870-5},
}