Method for efficient flash bit cell current compression in deeply erased bits

Jon Nafziger, Dan Burggraf. Method for efficient flash bit cell current compression in deeply erased bits. In Sixteenth International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, March 2-4, 2015. pages 77-81, IEEE, 2015. [doi]

Authors

Jon Nafziger

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Dan Burggraf

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