P. Nagabhushan, D. S. Guru, B. H. Shekar. Eigen Transformation Based Edge Detector for Gray Images. In Sankar K. Pal, Sanghamitra Bandyopadhyay, Sambhunath Biswas, editors, Pattern Recognition and Machine Intelligence, First International Conference, PReMI 2005, Kolkata, India, December 20-22, 2005, Proceedings. Volume 3776 of Lecture Notes in Computer Science, pages 434-440, Springer, 2005. [doi]
Abstract is missing.