Nachiappan Nagappan, Thomas Ball. Use of relative code churn measures to predict system defect density. In Gruia-Catalin Roman, William G. Griswold, Bashar Nuseibeh, editors, 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA. pages 284-292, ACM, 2005. [doi]
Abstract is missing.