Nachiappan Nagappan, Thomas Ball. Static analysis tools as early indicators of pre-release defect density. In Gruia-Catalin Roman, William G. Griswold, Bashar Nuseibeh, editors, 27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA. pages 580-586, ACM, 2005. [doi]
@inproceedings{NagappanB05a,
title = {Static analysis tools as early indicators of pre-release defect density},
author = {Nachiappan Nagappan and Thomas Ball},
year = {2005},
doi = {10.1145/1062455.1062558},
url = {http://doi.acm.org/10.1145/1062455.1062558},
tags = {analysis, static analysis},
researchr = {https://researchr.org/publication/NagappanB05a},
cites = {0},
citedby = {0},
pages = {580-586},
booktitle = {27th International Conference on Software Engineering (ICSE 2005), 15-21 May 2005, St. Louis, Missouri, USA},
editor = {Gruia-Catalin Roman and William G. Griswold and Bashar Nuseibeh},
publisher = {ACM},
}