Embedded Tutorial: Modeling Parasitic Coupling Effects in Reliability Verification - researchr publication authors

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N. S. Nagaraj, Poras T. Balsara, Cyrus D. Cantrell. Embedded Tutorial: Modeling Parasitic Coupling Effects in Reliability Verification. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 141, IEEE Computer Society, 2002. [doi]

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