N. S. Nagaraj, William R. Hunter, Poras T. Balsara, Cyrus D. Cantrell. The Impact of Inductance on Transients Affecting Gate Oxide Reliability. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 709-713, IEEE Computer Society, 2005. [doi]
Abstract is missing.