Evaluation of Schottky barrier height at Silicide/Silicon interface of a Silicon Nanowire with Modulation Acceptor Doped Dielectric Shell

Soundarya Nagarajan, Daniel Hiller, Ingmar Ratschinski, Joachim Knoch, Thomas Mikolajick, Jens Trommer. Evaluation of Schottky barrier height at Silicide/Silicon interface of a Silicon Nanowire with Modulation Acceptor Doped Dielectric Shell. In Device Research Conference, DRC 2023, Santa Barbara, CA, USA, June 25-28, 2023. pages 1-2, IEEE, 2023. [doi]

@inproceedings{NagarajanHRKMT23,
  title = {Evaluation of Schottky barrier height at Silicide/Silicon interface of a Silicon Nanowire with Modulation Acceptor Doped Dielectric Shell},
  author = {Soundarya Nagarajan and Daniel Hiller and Ingmar Ratschinski and Joachim Knoch and Thomas Mikolajick and Jens Trommer},
  year = {2023},
  doi = {10.1109/DRC58590.2023.10186934},
  url = {https://doi.org/10.1109/DRC58590.2023.10186934},
  researchr = {https://researchr.org/publication/NagarajanHRKMT23},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {Device Research Conference, DRC 2023, Santa Barbara, CA, USA, June 25-28, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-2310-8},
}