Tsuyoshi Nagato, Takashi Fuse, Tetsuo Koezuka. Defect inspection technology for a gloss-coated surface using patterned illumination. In Philip R. Bingham, Edmund Y. Lam, editors, Image Processing: Machine Vision Applications VI, Burlingame, California, USA, February 3-7, 2013. Volume 8661 of SPIE Proceedings, pages 866110, SPIE, 2013. [doi]
Abstract is missing.