Product metrics for IEC 61131-3 languages

Anil Nair. Product metrics for IEC 61131-3 languages. In Proceedings of 2012 IEEE 17th International Conference on Emerging Technologies & Factory Automation, ETFA 2012, Krakow, Poland, September 17-21, 2012. pages 1-8, IEEE, 2012. [doi]

Abstract

Abstract is missing.