Aswathi R. Nair, Venu Anand, Sanjiv Sambandan. Bias stress induced threshold voltage shift in buckled thin film transistors. In TENCON 2019 - 2019 IEEE Region 10 Conference (TENCON), Kochi, India, October 17-20, 2019. pages 78-81, IEEE, 2019. [doi]
Abstract is missing.