Arun A. Nair, Lizy Kurian John, Lieven Eeckhout. AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors. In 43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010, 4-8 December 2010, Atlanta, Georgia, USA. pages 125-136, IEEE, 2010. [doi]
@inproceedings{NairJE10,
title = {AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors},
author = {Arun A. Nair and Lizy Kurian John and Lieven Eeckhout},
year = {2010},
doi = {10.1109/MICRO.2010.34},
url = {http://dx.doi.org/10.1109/MICRO.2010.34},
researchr = {https://researchr.org/publication/NairJE10},
cites = {0},
citedby = {0},
pages = {125-136},
booktitle = {43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010, 4-8 December 2010, Atlanta, Georgia, USA},
publisher = {IEEE},
isbn = {978-0-7695-4299-7},
}