Arun A. Nair, Lizy Kurian John, Lieven Eeckhout. AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors. In 43rd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2010, 4-8 December 2010, Atlanta, Georgia, USA. pages 125-136, IEEE, 2010. [doi]
Abstract is missing.