Keyhan Najafian, Alireza Ghanbari, Ian Stavness, Lingling Jin, Gholam Hassan Shirdel, Farhad Maleki. A Semi-self-supervised Learning Approach for Wheat Head Detection using Extremely Small Number of Labeled Samples. In IEEE/CVF International Conference on Computer Vision Workshops, ICCVW 2021, Montreal, BC, Canada, October 11-17, 2021. pages 1342-1351, IEEE, 2021. [doi]
Abstract is missing.