Hiromi Nakagawa, Yusuke Iwasawa, Yutaka Matsuo. End-to-End Deep Knowledge Tracing by Learning Binary Question-Embedding. In Hanghang Tong, Zhenhui Jessie Li, Feida Zhu, Jeffrey Yu, editors, 2018 IEEE International Conference on Data Mining Workshops, ICDM Workshops, Singapore, Singapore, November 17-20, 2018. pages 334-342, IEEE, 2018. [doi]
@inproceedings{NakagawaIM18,
title = {End-to-End Deep Knowledge Tracing by Learning Binary Question-Embedding},
author = {Hiromi Nakagawa and Yusuke Iwasawa and Yutaka Matsuo},
year = {2018},
doi = {10.1109/ICDMW.2018.00055},
url = {https://doi.org/10.1109/ICDMW.2018.00055},
researchr = {https://researchr.org/publication/NakagawaIM18},
cites = {0},
citedby = {0},
pages = {334-342},
booktitle = {2018 IEEE International Conference on Data Mining Workshops, ICDM Workshops, Singapore, Singapore, November 17-20, 2018},
editor = {Hanghang Tong and Zhenhui Jessie Li and Feida Zhu and Jeffrey Yu},
publisher = {IEEE},
isbn = {978-1-5386-9288-2},
}