Shuya Nakagawa, Takumi Miyazaki, Hiroki Ishikuro. A Digital-to-Resistance Converter with an Automatic Offset Calibration Method for Evaluating Dynamic Performance of Resistive Sensor Readout Circuits. In 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020, Dubrovnik, Croatia, May 25-28, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.