Ryuichi Nakajima, Kazuya Ioki, Jun Furuta, Kazutoshi Kobayashi. Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process. In Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos, editors, 28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Torino, Italy, September 12-14, 2022. pages 1-5, IEEE, 2022. [doi]
Abstract is missing.