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EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester

Koji Nakamae, Takashi Ishimura, Hiromu Fujioka. EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Systems and Computers in Japan, 31(8):41-48, 2000. [doi]

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Koji Nakamae

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Takashi Ishimura

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Hiromu Fujioka

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