Koji Nakamae - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 22 from 22

2022

Accurate measurement of charge density in nanoscale particles using an aperture optimization of Fourier based phase reconstructionTakuma Okada, Yoshihiro Midoh, Koji Nakamae, Noriyuki Miura. cimaging 2022: 1-5 [doi]

2018

Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscopeKatsuyoshi Miura, Atsuki Seko, Koji Nakamae. mr, 88:360-364, 2018. [doi]

2017

NBTI/PBTI tolerant arbiter PUF circuitsKoyo Suzuki, Katsuyoshi Miura, Koji Nakamae. iolts 2017: 80-84 [doi]

2016

A quantum watermarking scheme using simple and small-scale quantum circuitsS. Miyake, Koji Nakamae. qip, 15(5):1849-1864, 2016. [doi]

2015

Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown conditionKoichi Endo, Kenji Norimatsu, Tomonori Nakamura, Takashi Setoya, Koji Nakamae. mr, 55(9-10):1628-1633, 2015. [doi]

2011

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localizationKiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae. mr, 51(9-11):1624-1631, 2011. [doi]

2009

2007

Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspectionKoji Nakamae, Masaki Chikahisa, Hiromu Fujioka. ivc, 25(7):1117-1123, 2007. [doi]

2006

Image deblurring by the combined use of a super-resolution technique and inverse filteringYasuyuki Yamada, Koji Nakamae, Hiromu Fujioka. cimaging 2006: [doi]

2003

A low energy FIB processing, repair, and test systemKatsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka. mr, 43(9-11):1627-1631, 2003. [doi]

Cost Optimum Embedded DRAM Design by Yield AnalysisYouhei Zenda, Koji Nakamae, Hiromu Fujioka. mtdt 2003: 20 [doi]

2002

CAD navigation system, for backside waveform probing of CMOS devicesKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka. mr, 42(9-11):1679-1684, 2002. [doi]

2001

Development of an EB/FIB Integrated Test SystemKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka. mr, 41(9-10):1489-1494, 2001.

2000

EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB testerKoji Nakamae, Takashi Ishimura, Hiromu Fujioka. scjapan, 31(8):41-48, 2000. [doi]

1999

Intelligent EB Test System for Automatic VLSI Fault TracingKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka. ats 1999: 335-341 [doi]

1998

Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope imagesKoji Nakamae, Shinji Yokoyama, Atsushi Onishi, Hiromu Fujioka. scjapan, 29(4):70-78, 1998. [doi]

1997

Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout DataKatsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka. ats 1997: 162-167 [doi]

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test SystemKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka. et, 10(3):255-269, 1997. [doi]

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test systemKatsuyoshi Miura, Koji Nakamae, Hiromu Fujioka. aspdac 1997: 329-332 [doi]

1996

Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and CostHiromu Fujioka, Koji Nakamae, Akio Higashi. itc 1996: 793-799

How ATE Planning Affects LSI Manufacturing CostKoji Nakamae, Homare Sakamoto, Hiromu Fujioka. dt, 13(4):66-73, 1996. [doi]

Sign in or sign up to see more results.

runs on WebDSL