Hiromu Fujioka, Koji Nakamae, Akio Higashi. Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 793-799, IEEE Computer Society, 1996.
Abstract is missing.