New Approach of Laser-SQUID Microscopy to LSI Failure Analysis

Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae. New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. IEICE Transactions, 92-C(3):327-333, 2009. [doi]

Abstract

Abstract is missing.