Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition

Koichi Endo, Kenji Norimatsu, Tomonori Nakamura, Takashi Setoya, Koji Nakamae. Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition. Microelectronics Reliability, 55(9-10):1628-1633, 2015. [doi]

Abstract

Abstract is missing.