Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Yoshiyuki Nakamura, Jacob Savir, Hideo Fujiwara. Effect of BIST Pretest on IC Defect Level. IEICE Transactions, 89-D(10):2626-2636, 2006. [doi]
Abstract is missing.