Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors

Masato Nakasato, Michiko Inoue, Satoshi Ohtake, Hideo Fujiwara. Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. IEICE Transactions, 91-D(3):763-770, 2008. [doi]

Abstract

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