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Analyzing relationship between the number of errors in review and debug processes for embedded software development projects

Toyoshiro Nakashima, Kazunori Iwata, Yoshiyuki Anan, Naohiro Ishii. Analyzing relationship between the number of errors in review and debug processes for embedded software development projects. In 2013 IEEE/ACIS 12th International Conference on Computer and Information Science, ICIS 2013, Niigata, Japan, June 16-20, 2013. pages 405-409, IEEE, 2013. [doi]

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Toyoshiro Nakashima

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Kazunori Iwata

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Yoshiyuki Anan

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Naohiro Ishii

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