Toyoshiro Nakashima, Kazunori Iwata, Yoshiyuki Anan, Naohiro Ishii. Analyzing relationship between the number of errors in review and debug processes for embedded software development projects. In 2013 IEEE/ACIS 12th International Conference on Computer and Information Science, ICIS 2013, Niigata, Japan, June 16-20, 2013. pages 405-409, IEEE, 2013. [doi]
@inproceedings{NakashimaIAI13,
title = {Analyzing relationship between the number of errors in review and debug processes for embedded software development projects},
author = {Toyoshiro Nakashima and Kazunori Iwata and Yoshiyuki Anan and Naohiro Ishii},
year = {2013},
doi = {10.1109/ICIS.2013.6607874},
url = {http://dx.doi.org/10.1109/ICIS.2013.6607874},
researchr = {https://researchr.org/publication/NakashimaIAI13},
cites = {0},
citedby = {0},
pages = {405-409},
booktitle = {2013 IEEE/ACIS 12th International Conference on Computer and Information Science, ICIS 2013, Niigata, Japan, June 16-20, 2013},
publisher = {IEEE},
}