Perfect model-following system using active disturbance rejection control

Hirotaka Nakayama, Ryo Tanaka, Yoshihisa Ishida, Naoki Matsumoto. Perfect model-following system using active disturbance rejection control. In IEEE 26th International Symposium on Industrial Electronics, ISIE 2017, Edinburgh, United Kingdom, June 19-21, 2017. pages 533-538, IEEE, 2017. [doi]

Abstract

Abstract is missing.