Toru Nakura, Naoki Terao, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada. Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-8, IEEE, 2016. [doi]
Abstract is missing.