A phase noise spectrum test solution for high volume mixed signal/wireless automatic test equipments - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Hui S. Nam, Bernard Cuddy, Dieter Luecking. A phase noise spectrum test solution for high volume mixed signal/wireless automatic test equipments. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 957-964, IEEE Computer Society, 2001.

This author has not been identified. Look up 'Hui S. Nam' in GoogleThis author has not been identified. Look up 'Bernard Cuddy' in GoogleThis author has not been identified. Look up 'Dieter Luecking' in Google

runs on WebDSL