David Nam, Judith Mantell, Lorna Hodgson, David R. Bull, Paul Verkade, Alin Achim. Feature-based registration for correlative light and electron microscopy images. In 2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014. pages 3567-3571, IEEE, 2014. [doi]
Abstract is missing.