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Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning

Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min-Sang Park, Hyun Chul Choi, Rock-Hyun Baek. Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. IEEE Access, 11:7135-7144, 2023. [doi]

Authors

Kihoon Nam

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Chanyang Park

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Hyeok Yun

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Jun-Sik Yoon

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Hyundong Jang

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Kyeongrae Cho

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Min-Sang Park

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Hyun Chul Choi

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Rock-Hyun Baek

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