Kihoon Nam, Chanyang Park, Hyeok Yun, Jun-Sik Yoon, Hyundong Jang, Kyeongrae Cho, Min-Sang Park, Hyun Chul Choi, Rock-Hyun Baek. Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning. IEEE Access, 11:7135-7144, 2023. [doi]
Abstract is missing.