Kazuteru Namba, Hideo Ito. Chiba Scan Delay Fault Testing with Short Test Application Time. J. Electronic Testing, 26(6):667-677, 2010. [doi]
@article{NambaI10,
title = {Chiba Scan Delay Fault Testing with Short Test Application Time},
author = {Kazuteru Namba and Hideo Ito},
year = {2010},
doi = {10.1007/s10836-010-5177-4},
url = {http://dx.doi.org/10.1007/s10836-010-5177-4},
tags = {testing},
researchr = {https://researchr.org/publication/NambaI10},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {26},
number = {6},
pages = {667-677},
}