S. Nandi, Vamsi Boppana, Supratik Chakraborty, Parimal Pal Chaudhuri, Samir Roy. Delay Fault Test Generation with Cellular Automata. In VLSI Design. pages 281-286, 1993.
@inproceedings{NandiBCCR93,
title = {Delay Fault Test Generation with Cellular Automata},
author = {S. Nandi and Vamsi Boppana and Supratik Chakraborty and Parimal Pal Chaudhuri and Samir Roy},
year = {1993},
tags = {testing},
researchr = {https://researchr.org/publication/NandiBCCR93},
cites = {0},
citedby = {0},
pages = {281-286},
booktitle = {VLSI Design},
}