Kuntal Nanshi, Fabio Somenzi. Using Abstraction to Guide the Search for Long Error Traces. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(3):453-466, 2013. [doi]
@article{NanshiS13,
title = {Using Abstraction to Guide the Search for Long Error Traces},
author = {Kuntal Nanshi and Fabio Somenzi},
year = {2013},
doi = {10.1109/TCAD.2012.2228266},
url = {http://dx.doi.org/10.1109/TCAD.2012.2228266},
researchr = {https://researchr.org/publication/NanshiS13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {3},
pages = {453-466},
}