Noise analysis methodology for partially depleted SOI circuits

Mini Nanua, David T. Blaauw. Noise analysis methodology for partially depleted SOI circuits. In Proceedings of the IEEE Custom Integrated Circuits Conference, CICC 2003, San Jose, CA, USA, September 21 - 24, 2003. pages 719-722, IEEE, 2003. [doi]

Authors

Mini Nanua

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David T. Blaauw

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