Case studies of defect localization based on software-based fault diagnosis in comparison with PEMS/OBIRCH analysis

Takuya Naoe, Taketoshi Mizobe, Kohichi Yokoyama. Case studies of defect localization based on software-based fault diagnosis in comparison with PEMS/OBIRCH analysis. Microelectronics Reliability, 54(6-7):1433-1442, 2014. [doi]

Abstract

Abstract is missing.