Sridhar Narayanan, Melvin A. Breuer. Reconfigurable scan chains: a novel approach to reduce test application time. In Michael R. Lightner, Jochen A. G. Jess, editors, Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993. pages 710-715, IEEE Computer Society, 1993. [doi]
@inproceedings{NarayananB93,
title = {Reconfigurable scan chains: a novel approach to reduce test application time},
author = {Sridhar Narayanan and Melvin A. Breuer},
year = {1993},
doi = {10.1145/259794.259907},
url = {http://doi.acm.org/10.1145/259794.259907},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/NarayananB93},
cites = {0},
citedby = {0},
pages = {710-715},
booktitle = {Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993, Santa Clara, California, USA, November 7-11, 1993},
editor = {Michael R. Lightner and Jochen A. G. Jess},
publisher = {IEEE Computer Society},
isbn = {0-8186-4490-7},
}