Configuring multiple scan chains for minimum test time

Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer. Configuring multiple scan chains for minimum test time. In ICCAD. pages 4-8, 1992. [doi]

@inproceedings{NarayananGB92,
  title = {Configuring multiple scan chains for minimum test time},
  author = {Sridhar Narayanan and Rajesh Gupta and Melvin A. Breuer},
  year = {1992},
  doi = {10.1145/304032.304041},
  url = {http://doi.acm.org/10.1145/304032.304041},
  tags = {testing},
  researchr = {https://researchr.org/publication/NarayananGB92},
  cites = {0},
  citedby = {0},
  pages = {4-8},
  booktitle = {ICCAD},
}