Niranjhana Narayanan, Karthik Pattabiraman. TF-DM: Tool for Studying ML Model Resilience to Data Faults. In 3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021. pages 25-28, IEEE, 2021. [doi]
@inproceedings{NarayananP21,
title = {TF-DM: Tool for Studying ML Model Resilience to Data Faults},
author = {Niranjhana Narayanan and Karthik Pattabiraman},
year = {2021},
doi = {10.1109/DeepTest52559.2021.00010},
url = {https://doi.org/10.1109/DeepTest52559.2021.00010},
researchr = {https://researchr.org/publication/NarayananP21},
cites = {0},
citedby = {0},
pages = {25-28},
booktitle = {3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4565-8},
}