Niranjhana Narayanan, Karthik Pattabiraman. TF-DM: Tool for Studying ML Model Resilience to Data Faults. In 3rd IEEE/ACM International Workshop on Deep Learning for Testing and Testing for Deep Learning, DeepTest@ICSE 2021, Madrid, Spain, June 1, 2021. pages 25-28, IEEE, 2021. [doi]
Abstract is missing.