Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat. A fault diagnosis methodology for the UltraSPARC:::TM:::-I microprocessor. In European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997. pages 494-500, IEEE, 1997. [doi]
@inproceedings{NarayananSKLB97,
title = {A fault diagnosis methodology for the UltraSPARC:::TM:::-I microprocessor},
author = {Sridhar Narayanan and R. Srinivasan and R. P. Kunda and Marc E. Levitt and Saied Bozorgui-Nesbat},
year = {1997},
doi = {10.1109/EDTC.1997.582406},
url = {http://dx.doi.org/10.1109/EDTC.1997.582406},
researchr = {https://researchr.org/publication/NarayananSKLB97},
cites = {0},
citedby = {0},
pages = {494-500},
booktitle = {European Design and Test Conference (ED&TC 97), Paris, France, 17-20 March 1997},
publisher = {IEEE},
}