Vivek Sivaraman Narayanaswamy, Yamen Mubarka, Rushil Anirudh, Deepta Rajan, Jayaraman J. Thiagarajan. Exploring Inlier and Outlier Specification for Improved Medical OOD Detection. In IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Workshops, Paris, France, October 2-6, 2023. pages 4591-4600, IEEE, 2023. [doi]
@inproceedings{NarayanaswamyMA23,
title = {Exploring Inlier and Outlier Specification for Improved Medical OOD Detection},
author = {Vivek Sivaraman Narayanaswamy and Yamen Mubarka and Rushil Anirudh and Deepta Rajan and Jayaraman J. Thiagarajan},
year = {2023},
doi = {10.1109/ICCVW60793.2023.00493},
url = {https://doi.org/10.1109/ICCVW60793.2023.00493},
researchr = {https://researchr.org/publication/NarayanaswamyMA23},
cites = {0},
citedby = {0},
pages = {4591-4600},
booktitle = {IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Workshops, Paris, France, October 2-6, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0744-3},
}