Exploring Inlier and Outlier Specification for Improved Medical OOD Detection

Vivek Sivaraman Narayanaswamy, Yamen Mubarka, Rushil Anirudh, Deepta Rajan, Jayaraman J. Thiagarajan. Exploring Inlier and Outlier Specification for Improved Medical OOD Detection. In IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Workshops, Paris, France, October 2-6, 2023. pages 4591-4600, IEEE, 2023. [doi]

Abstract

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