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Verification Of Data-Intensive Embedded Systems

Massimo Narizzano, Armando Tacchella. Verification Of Data-Intensive Embedded Systems. In Enrico Vicario, Romeo Bandinelli, Virginia Fani, Michele Mastroianni, editors, Proceedings of the 37th ECMS International Conference on Modelling and Simulation, ECMS 2023, Florence, Italy, June 20-23, 2023. pages 521-527, European Council for Modeling and Simulation, 2023. [doi]

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