Need for information metrics: with examples from document analysis

Thomas A. Nartker. Need for information metrics: with examples from document analysis. In Luc M. Vincent, Theo Pavlidis, editors, Document Recognition, San Jose, CA, USA, February 6, 1994. Volume 2181 of SPIE Proceedings, pages 184-193, SPIE, 1994. [doi]

Abstract

Abstract is missing.